Low-flux electron irradiation
Facility Focal-e supports you in the effect characterization of your units or components when irradiated under a low fluence of electrons.

Focal-e
- Facility for low electrons flux effect characterization (individual event analysis)
- ex.: Jupiter mission (JUICE), GEO orbit ...
- Electron flux adjustable from 0 to 6000 e-/cm².s
- Electron energy range : 0 to 3.5 MeV
- Vacuum 1E-6 mbar
- Liquid Nitrogen available in the vacuum chamber (or in customer cryostat)
- Measurements can be done in vacuum or at atmospheric pressure (automated motor positioning of e- sources) with < 0.1 µm positioning accuracy
- In situ ultra-high resolution electron spectrometer (1.7 keV @ 624 keV)
- Electron absorption in material/component measurement (energy spectrum)
- Mass spectrometer (Residual Gas Analyzer) connected to the chamber
- Pressure and temperatures data logging
- Data logging available over internet (teletest CSL software)
- Oil free pumping
- Facility can be moved in clean room (class 100)
Focal-e was recently developed with Prodex support (2016)
updated on 9/13/18
