Surface characterization

• Ellipsometers :
  • UV-Visible-NIR (Sentec SE 800)
  • IR (Sentec Sendira).
• Spectrophotometers :
  • UV-Visible-NIR (Perkin Elmer Lambda 950)
  • UV-Visible-NIR (Perkin Elmer Lambda 1050)
  • FTIR (Thermo Scientific Nicolet IS50)

        Accessories :

• An  MID-IR 3” integrating sphere
• A 150 mm integrating sphere with PMT and InGaAs detectors
• Small Spot IV directional absolute reflectance measurements accessory (TNO)
• Cryostat compatible with the IV accessory (regulation from 80K to 310K in a vacuum chamber)
• A fibre optic coupler (FiberMate2)
  
  
• Optical profiler (interferometric microscopy): Bruker Contour GTI
• Digital microscope : Keyence VHX-5000
• Scanning electron microscope (SEM): Hitachi S-3500M
• Atomic force microscope (AFM): Nanosurf EasyScan DFM
• Contact angle measuring system (surface wettability): KRUS DSA
• Four-point probe (electrical resistivity): Jandel  RM3
• Refractometer (refractive index of liquids) : Anton Paar Abbemat
• Laser thermoreflectance setup
• Surface Plasmon Resonance (SPR) Kretschmann setup