Surface characterization

Surface characterization

• Ellipsometry UV, Visible and IR (thin films and coatings characterization: measurement of coating thickness and refractive index) [45].
• Spectrophotometry UV, Visible and IR (reflectivity, absorption, solar absorptance and transmission).
• Topography and roughness measurement of surfaces using optical profilometry (interferometric microscopy) [49, 56], stylus profilometry, digital microscopy, scanning electron microscopy and atomic force microscopy.
• Laser thermoreflectance for semiconductor thin films [10, 16].
• Other surface measurements as surface wettability and surface electrical resistivity (four-point probe).

CSL has performed measurements for industrial partners and international space missions such as: the James Webb Telescope, PROBA, MTG, Chandrayaan, Solar Orbiter, GAIA, Sentinel (2, 3 & 5) ...

Measurement of the diffractive structures of an intra-ocular lens (IOL) with interferometric microscopy.